Datenblatt für TS3L501E von Texas Instruments

1!. B X E I TEXAS INSTRUMENTS
A0
A1
A2
A3
A4
A5
A6
A7
B0
B1
B2
B3
B4
B5
B6
C1
C2
C3
C4
C5
C6
C7
SEL
B7
C0
LED_A0
LED_B1
LED_B0
LED_A1
LED_A2LED_B2
LED_C1
LED_C0
LED_C2
PD
Control Logic
POWER DOWN
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An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
TS3L501E
SCDS307C –SEPTEMBER 2010REVISED DECEMBER 2017
TS3L501E 8-Channel SPDT/16-Bit to 8-Bit Multiplexer and Demultiplexer
Ethernet LAN Switch With Power-Down Mode
1
1 Features
1 Integrated Power-Down Mode
Wide Bandwidth (BW = 600 MHz Typical)
Low Crosstalk (XTALK = –37 dB Typical
at 250 MHz)
Low Bit-to-Bit Skew (tsk(o) = 100 ps Maximum)
Low and Flat ON-State Resistance
(ron = 4 ΩTypical, ron(flat) = 0.5 ΩTypical)
Low Input and Output Capacitance
(CON = 9 pF Typical)
Rail-to-Rail Switching on Data I/O Ports
(0 V to 3.6 V)
• VCC Operating Range From 3 V to 3.6 V
Support Power-Down Mode
Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
ESD Performance (A, B, C, LED pins)
±4-kV IEC61000-4-2, Contact Discharge
6-kV Human Body Model Per JESD22-A114E
(Switch I/O pins to GND)
ESD Performance (All pins)
2-kV Human Body Model Per JESD22-A114E
2 Applications
10, 100, and 1000 Base-T Signal Switching
Differential (LVDS, LVPECL) Signal Switching
Audio and Video Switching
Hub and Router Signal Switching
3 Description
The TS3L501E is a 8-channel SPDT analog switch or
16-bit to 8-bit multiplexer or demultiplexer LAN switch
with a single select (SEL) input and Power-Down
Mode input. The device provides additional I/Os for
switching status indicating LED signals and includes
high ESD protection. SEL input controls the data path
of the multiplexer or demultiplexer. Power-down input
can put the device into the standby mode for
minimizing current consumption per mode selection.
The device provides a low and flat ON-state
resistance (ron) and an excellent ON-state resistance
match. Low input or output capacitance, high
bandwidth, low skew, and low crosstalk among
channels make this device suitable for various LAN
applications, such as 10/100/1000 Base-T. This
device can be used to replace mechanical relays in
LAN applications. It also can be used to route signals
from a 10/100 Base-T Ethernet transceiver to the RJ-
45 LAN connectors in laptops or in docking stations.
It is characterized for operation over the free-air
temperature range of –40ºC to 85ºC.
Device Information(1)
PART NUMBER PACKAGE BODY SIZE (NOM)
TS3L501E WQFN (42) 9.00 mm × 3.50 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
Functional Block Diagram
l TEXAS INSTRUMENTS
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TS3L501E
SCDS307C –SEPTEMBER 2010REVISED DECEMBER 2017
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Table of Contents
1 Features.................................................................. 1
2 Applications ........................................................... 1
3 Description ............................................................. 1
4 Revision History..................................................... 2
5 Pin Configuration and Functions......................... 3
6 Specifications......................................................... 5
6.1 Absolute Maximum Ratings ..................................... 5
6.2 ESD Ratings.............................................................. 5
6.3 Recommended Operating Conditions....................... 5
6.4 Thermal Information.................................................. 6
6.5 Electrical Characteristics for 1000 Base-T Ethernet
Switching.................................................................... 6
6.6 Electrical Characteristics for 10/100 Base-T Ethernet
Switching.................................................................... 6
6.7 Switching Characteristics.......................................... 7
6.8 Dynamic Characteristics ........................................... 7
6.9 Typical Characteristics.............................................. 8
7 Parameter Measurement Information .................. 9
7.1 Enable and Disable Times........................................ 9
7.2 Skew ....................................................................... 10
7.3 HP8753ES Setup.................................................... 11
7.4 HP8753ES Setup.................................................... 12
7.5 HP8753ES Setup.................................................... 13
8 Detailed Description............................................ 14
8.1 Overview ................................................................. 14
8.2 Functional Block Diagram....................................... 14
8.3 Feature Description................................................. 14
8.4 Device Functional Modes........................................ 14
9 Application and Implementation ........................ 15
9.1 Application Information............................................ 15
9.2 Typical Application ................................................. 15
10 Power Supply Recommendations ..................... 17
11 Layout................................................................... 17
11.1 Layout Guidelines ................................................. 17
11.2 Layout Example .................................................... 18
12 Device and Documentation Support ................. 19
12.1 Documentation Support ........................................ 19
12.2 Receiving Notification of Documentation Updates 19
12.3 Community Resources.......................................... 19
12.4 Trademarks........................................................... 19
12.5 Electrostatic Discharge Caution............................ 19
12.6 Glossary................................................................ 19
13 Mechanical, Packaging, and Orderable
Information ........................................................... 19
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision B (May 2016) to Revision C Page
Added pin numbers 4, 8, 14, 21, 30, 39 to VDD in the Pin Functions table ............................................................................ 4
Changes from Revision A (September 2010) to Revision B Page
Added ESD Ratings table, Feature Description section, Device Functional Modes,Application and Implementation
section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and
Mechanical, Packaging, and Orderable Information section.................................................................................................. 1
Removed Ordering Information table .................................................................................................................................... 1
@@@@@@@@@@@ ® ® SW S": DEDDDDDDDEEDEEE ‘5‘ TEXAS INSTRUMENTS
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B0
B4
C0
C4
B2
B6
C2
C6
B1
B5
C1
C5
B3
B7
C3
C7
VDD
VDD
A0
A1
VDD
VDD
VDD
PD
A2
A3
A4
A5
A6
A7
SEL
LED_A0
LED_ A1
LED_ B0
VDD
LED_B1
LED_C0
LED_C1
VDD
LED_A2
LED_ B2
LED_ C2
Exposed
Center Pad
(GND)
3
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5 Pin Configuration and Functions
RUA Package
42-Pin WQFN
Top View
The exposed center pad must be connected to GND.
Pin Functions
PIN I/O DESCRIPTION
NAME NO.
A02 I/O Port A Common I/O signal path
A13 I/O Port A Common I/O signal path
A26 I/O Port A Common I/O signal path
A37 I/O Port A Common I/O signal path
A49 I/O Port A Common I/O signal path
A510 I/O Port A Common I/O signal path
A611 I/O Port A Common I/O signal path
A712 I/O Port A Common I/O signal path
B038 I/O Port B I/O signal path
B137 I/O Port B I/O signal path
B234 I/O Port B I/O signal path
B333 I/O Port B I/O signal path
B429 I/O Port B I/O signal path
B528 I/O Port B I/O signal path
B625 I/O Port B I/O signal path
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TS3L501E
SCDS307C –SEPTEMBER 2010REVISED DECEMBER 2017
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Pin Functions (continued)
PIN I/O DESCRIPTION
NAME NO.
B724 I/O Port B I/O signal path
C036 I/O Port C I/O signal path
C135 I/O Port C I/O signal path
C232 I/O Port C I/O signal path
C331 I/O Port C I/O signal path
C427 I/O Port C I/O signal path
C526 I/O Port C I/O signal path
C623 I/O Port C I/O signal path
C722 I/O Port C I/O signal path
GND Exposed Center Pad Ground
LED_A015 I/O Port A LED I/O Common signal path, (may also be used as a general
purpose signal path)
LED_A116 I/O Port A LED Common I/O signal path, (may also be used as a general
purpose signal path)
LED_A242 I/O Port A LED Common I/O signal path, (may also be used as a general
purpose signal path)
LED_B017 I/O Port B LED I/O signal path, (may also be used as a general purpose
signal path)
LED_B118 I/O Port B LED I/O signal path, (may also be used as a general purpose
signal path)
LED_B241 I/O Port B LED I/O signal path, (may also be used as a general purpose
signal path)
LED_C019 I/O Port C LED I/O signal path, (may also be used as a general purpose
signal path)
LED_C120 I/O Port C LED I/O signal path, (may also be used as a general purpose
signal path)
LED_C240 I/O Port C LED I/O signal path, (may also be used as a general purpose
signal path)
PD 5 Input Power Down Input, Active High
SEL 13 Input Select Input
VDD 1, 4, 8, 14, 21, 30, 39 Power
l TEXAS INSTRUMENTS
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(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltages are with respect to ground, unless otherwise specified.
(3) The input and output voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
(4) VIand VOare used to denote specific conditions for VI/O.
(5) IIand IOare used to denote specific conditions for II/O.
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
VDD Supply voltage –0.5 4.6 V
VIN Control input voltage(2) (3) –0.5 7 V
VI/O Switch I/O voltage(2) (3) (4) –0.5 7 V
IIK Control input clamp current VIN < 0 –50 mA
II/OK I/O port clamp current VI/O < 0 –50 mA
II/O ON-state switch current(5) ±128 mA
Continuous current through VDD or GND ±100 mA
Tstg Storage temperature –65 150 °C
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.2 ESD Ratings
VALUE UNIT
V(ESD) Electrostatic discharge
Human-body model (HBM), per
ANSI/ESDA/JEDEC JS-001(1)
All pins except 1, 4, 5, 8,
13, 14, 21, 30, and 39 ±6000
VPins 1, 4, 5, 8, 13, 14, 21,
30, and 39 ±2000
Charged-device model (CDM), per JEDEC specification JESD22-C101(2) ±1500
(1) All unused control inputs of the device must be held at VDD or GND to ensure proper device operation. See the TI application report,
Implications of Slow or Floating CMOS Inputs,SCBA004.
6.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
VDD Supply voltage 3 3.6 V
VIH High-level control input voltage (SEL) 2 5.5 V
VIL Low-level control input voltage (SEL) 0 0.8 V
VIN Input voltage (SEL) 0 5.5 V
VI/O Input or output voltage 0 VDD V
TAOperating free-air temperature –40 85 °C
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TS3L501E
SCDS307C –SEPTEMBER 2010REVISED DECEMBER 2017
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(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
(2) The package thermal impedance is calculated in accordance with JESD 51-7.
6.4 Thermal Information
THERMAL METRIC(1)
TS3L501E
UNITRUA (WQFN)
42 PINS
RθJA Junction-to-ambient thermal resistance(2) 30.9 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 12.8 °C/W
RθJB Junction-to-board thermal resistance 5.2 °C/W
ψJT Junction-to-top characterization parameter 0.2 °C/W
ψJB Junction-to-board characterization parameter 5 °C/W
RθJC(bot) Junction-to-case (bottom) thermal resistance 1.5 °C/W
(1) VI, VO, II, and IOrefer to I/O pins. VIN refers to the control inputs.
(2) All typical values are at VDD = 3.3 V (unless otherwise noted), TA= 25°C.
(3) ron(flat) is the difference of ron in a given channel at specified voltages.
(4) Δron is the difference of ron from center (A4, A5) ports to any other port.
6.5 Electrical Characteristics for 1000 Base-T Ethernet Switching
for 1000 Base-T Ethernet switching over recommended operating free-air temperature range, VDD = 3.3 V ± 0.3 V
(unless otherwise noted)
PARAMETER TEST CONDITIONS(1) MIN TYP(2) MAX UNIT
VIK SEL, PD VDD = 3.6 V, IIN = –18 mA –0.7 –1.2 V
IIH SEL, PD VDD = 3.6 V, VIN = VDD ±2 μA
IIL SEL, PD VDD = 3.6 V, VIN = GND ±1 μA
IOFF SEL, PD VDD = 0 V, VIN = 0 to 3.6 V ±1 μA
ICC VDD = 3.6 V, II/O = 0, switch ON or OFF 250 600 μA
ICC_PD VDD = 3.6 V, VIN = 3.6 V, PD = high 1
CIN SEL, PD f = 1 MHz, VIN = 0 2.6 3 pF
COFF B or C port VI= 0,f = 1 MHz, outputs open, switch OFF 3 4 pF
CON VI= 0,f = 1 MHz, outputs open, switch ON 9 9.8 pF
ron VDD = 3 V, 1.5 V VIVDD, IO= –40 mA 4 8
ron(flat) (3) VDD = 3 V, VI= 1.5 V and VDD, IO= –40 mA 0.7
Δron (4) VDD = 3 V, 1.5 V VIVDD, IO= –40 mA 0.8 1.5
(1) VI, VO, II, and IOrefer to I/O pins. VIN refers to the control inputs.
(2) All typical values are at VDD = 3.3 V (unless otherwise noted), TA= 25°C.
(3) ron(flat) is the difference of ron in a given channel at specified voltages.
(4) Δron is the difference of ron from center (A4, A5) ports to any other port.
6.6 Electrical Characteristics for 10/100 Base-T Ethernet Switching
for 10/100 Base-T Ethernet switching over recommended operating free-air temperature range, VDD = 3.3 V ± 0.3 V
(unless otherwise noted)
PARAMETER TEST CONDITIONS(1) MIN TYP(2) MAX UNIT
VIK SEL, PD VDD = 3.6 V, IIN = –18 mA –0.7 –1.2 V
IIH SEL, PD VDD = 3.6 V, VIN = VDD ±2 μA
IIL SEL, PD VDD = 3.6 V, VIN = GND ±1 μA
IOFF SEL, PD VDD = 0 V, VIN = 0 to 3.6 V ±1 μA
ICC VDD = 3.6 V, II/O = 0, switch ON or OFF 250 600 μA
ICC_PD VDD = 3.6 V, VIN = 3.6 V, PD = high 1
CIN SEL, PD f = 1 MHz, VIN = 0 2.6 3.0 pF
COFF B or C port VI= 0,f = 10 MHz, outputs open, switch OFF 3 4 pF
CON VI= 0,f = 10 MHz, outputs open, switch ON 9 9.8 pF
ron VDD = 3 V, 1.25 V VIVDD, IO= –10 mA to –30 mA 4 6
ron(flat) (3) VDD = 3 V, VI= 1.25 V and VDD, IO= –10 mA to –30 mA 0.5
Δron (4) VDD = 3 V, 1.25 V VIVDD, IO= –10 mA to –30 mA 0.8 1.5
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(1) All typical values are at VDD = 3.3 V (unless otherwise noted), TA= 25°C.
(2) The propagation delay is the calculated RC time constant of the typical ON-state resistance of the switch and the specified load
capacitance when driven by an ideal voltage source (zero output impedance).
(3) Output skew between center port (A4to A5) to any other port
(4) Skew between opposite transitions of the same output in a given device |tPHL – tPLH|
(5) Device enable/disable time from PD
6.7 Switching Characteristics
over recommended operating free-air temperature range, VDD = 3.3 V ± 0.3 V, RL= 200 , CL= 10 pF
(unless otherwise noted) (see Figure 5 and Figure 6)
PARAMETER FROM
(INPUT) TO
(OUTPUT) MIN TYP(1) MAX UNIT
tpd (2) A or B/C B/C or A 0.3 ns
tPZH, tPZL SEL A or B/C 0.5 15 ns
tPHZ, tPLZ SEL A or B/C 0.9 9 ns
tsk(o) (3) A or B/C B/C or A 50 100 ps
tsk(p) (4) A or B/C B/C or A 50 100 ps
tON/tOFF(5) PD A or B/C 250 ns
(1) All typical values are at VCC = 3.3 V (unless otherwise noted), TA= 25°C.
6.8 Dynamic Characteristics
over recommended operating free-air temperature range, VDD = 3.3 V ± 0.3 V (unless otherwise noted)
PARAMETER TEST CONDITIONS TYP(1) UNIT
XTALK RL= 50 , f = 250 MHz, see Figure 8 –37 dB
OIRR RL= 50 , f = 250 MHz, see Figure 9 –37 dB
BW See Figure 7 600 MHz
l TEXAS INSTRUMENTS
3.5
3
2.5
2
1.5
1
0.5
0
0 0.5 1 1.5 2 2.5 3 3.5 4
V -InputVoltage-V
I
R -On-Resistance-
ON W
-19.97
-29.97
-39.97
-49.97
-59.97
-69.97
-79.97
-89.97
-99.97
-109.97
1.00E+6 10.00E+6 100.00E+6 1.00E+9 10.00E+9
f-Frequency-Hz
Attenuation-dB
f - Frequency - Hz
Gain - dB
-16
-14
-12
-10
-8
-6
-4
-2
0
1.00E+06 10.00E+06 100.00E+06 1.00E+09 10.00E+09
8
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6.9 Typical Characteristics
Figure 1. Gain vs Frequency Figure 2. OFF Isolation vs Frequency
Figure 3. Crosstalk vs Frequency Figure 4. ron () vs Vcom (V)
‘5‘ TEXAS INSTRUMENTS En sz F'ZL
CL
(see Note A)
TEST CIRCUIT
S1
2×VDD
Open
GND
RL
RL
NOTES: A. CLincludes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR10 MHz, ZO= 50 W, tr2.5 ns, tf2.5 ns.
D. The outputs are measured one at a time, with one transition per measurement.
E. tPLZ and tPHZ are the same as tdis.
F. tPZL and tPZH are the same as ten.
50 W
VG1
VDD
DUT
50 W
VIN
50 W
VG2 50 W
VI
TEST RL
S1 VD
CL
VDD Vin
tPLZ/tPZL 2×VDD 200 WGND 10 pF 0.3 V
Input Generator
Input Generator VO
tPHZ/tPZH
3.3 V
3.3 V GND 200 WVDD 10 pF 0.3 V
tPZL
VOH - 0.3 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
VDD/2
VDD/2
Output Control
(VIN)1.25 V
2.5 V
VOH
VOL + 0.3 V
VOH
VOL
0 V
1.25 V
tPZH
tPLZ
tPHZ
Output
Waveform 2
S1 at GND
(see Note B)
Output
Waveform 1
S1 at 2 VDD
(see Note B)
VOL
VO
VI
VO
9
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7 Parameter Measurement Information
7.1 Enable and Disable Times
Figure 5. Test Circuit and Voltage Waveforms
_________ ____a
CL
(see Note A)
TEST CIRCUIT
S1
2×VDD
Open
GND
RL
RL
VOH
VOL
VOLTAGE WAVEFORMS
OUTPUT SKEW (tsk(o))
Data Out at
YB1or YB2
NOTES: A. CLincludes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR10 MHz, ZO= 50 W, tr2.5 ns, tf2.5 ns.
D. The outputs are measured one at a time, with one transition per measurement.
50 W
VG1
VDD
DUT
50 W
VIN
50 W
VG2 50 W
VI
TEST RL
S1 CL
3.3 V ±0.3 V
VDD Vin
tsk(p)
tsk(o)
3.3 V ±0.3 V
Open
Open
200 W
200 W
VDD or GND
VDD or GND
10 pF
10 pF
Input Generator
Input Generator VO
(VOH + VOL)/2
VOH
VOL
Data Out at
XB1or XB2
(VOH + VOL)/2
3.5 V
1.5 V
Data In at
Ax or Ay 2.5 V
tPLHx tPHLx
tsk(o) tsk(o)
tPLHy tPHLy
tsk(o) = t PLHy - t PLHx or t PHLy - t PHLx
VOH
VOL
VOLTAGE WAVEFORMS
PULSE SKEW [tsk(p)]
Output (VOH + VOL)/2
Input 2.5 V
tPLH tPHL
tsk(p) = t PHL - t PLH
3.5 V
1.5 V
VO
VI
VO
10
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7.2 Skew
Figure 6. Test Circuit and Voltage Waveforms
l TEXAS INSTRUMENTS “HF.
Network Analyzer
(HP8753ES)
EXT TRIGGER
BIAS
P1 P2
DUT
A0
SEL
0B1
VSEL
VDD
VBIAS
CL= 10 pF
(see Note A)
11
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Skew (continued)
A. CLincludes probe and jig capacitance.
Figure 7. Test Circuit for Frequency Response (BW)
Frequency response is measured at the output of the ON channel. For example, when VSEL = 0 and A0is the
input, the output is measured at 0B1. All unused analog I/O ports are left open.
7.3 HP8753ES Setup
Average = 4
RBW = 3 kHz
VBIAS = 0.35 V
ST=2s
P1 = 0 dBM
l TEXAS INSTRUMENTS i T
Network Analyzer
(HP8753ES)
RL= 50 W
EXT TRIGGER
BIAS
P1 P2
DUT
A0
SEL
0B1
VSEL
VDD
VBIAS
A1
1B2
1B1
RL= 50 W
2B1
3B1
A2
A3
0B2
3B2
2B2
12
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HP8753ES Setup (continued)
A. CLincludes probe and jig capacitance.
B. A 50-termination resistor is needed to match the loading of the network analyzer.
Figure 8. Test Circuit for Crosstalk (XTALK)
Crosstalk is measured at the output of the nonadjacent ON channel. For example, when VSEL = 0 and A1is the
input, the output is measured at A3. All unused analog input (A) ports are connected to GND, and output (B)
ports are left open.
7.4 HP8753ES Setup
Average = 4
RBW = 3 kHz
VBIAS = 0.35 V
ST=2s
P1 = 0 dBM
l TEXAS INSTRUMENTS
Network Analyzer
(HP8753ES)
RL= 50 W
EXT TRIGGER
BIAS
P1 P2
DUT
A0
SEL
0B1
VSEL
VDD
VBIAS
0B2
A11B1
1B2
13
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HP8753ES Setup (continued)
A. CLincludes probe and jig capacitance.
B. A 50-termination resistor is needed to match the loading of the network analyzer.
Figure 9. Test Circuit for OFF Isolation (OIRR)
OFF isolation is measured at the output of the OFF channel. For example, when VSEL = GND and A1is the input,
the output is measured at 1B2. All unused analog input (A) ports are connected to ground, and output (B) ports
are left open.
7.5 HP8753ES Setup
Average = 4
RBW = 3 kHz
VBIAS = 0.35 V
ST=2s
P1 = 0 dBM
l TEXAS INSTRUMENTS
A0
A1
A2
A3
A4
A5
A6
A7
B0
B1
B2
B3
B4
B5
B6
C1
C2
C3
C4
C5
C6
C7
SEL
B7
C0
LED_A0
LED_B1
LED_B0
LED_A1
LED_A2LED_B2
LED_C1
LED_C0
LED_C2
PD
Control Logic
POWER DOWN
Copyright © 2016, Texas Instruments Incorporated
14
TS3L501E
SCDS307C –SEPTEMBER 2010REVISED DECEMBER 2017
www.ti.com
Product Folder Links: TS3L501E
Submit Documentation Feedback Copyright © 2010–2017, Texas Instruments Incorporated
8 Detailed Description
8.1 Overview
The TS3L501E is a 8-channel SPDT analog switch or 16-bit to 8-bit multiplexer/demultiplexer LAN switch with a
single select (SEL) input and Power Down Mode input. The device provides additional I/Os for switching status
indicating LED signals and includes high ESD protection. SEL input controls the data path of the
multiplexer/demultiplexer. Power Down input can put the device into the standby mode for minimizing current
consumption per mode selection.
The device provides a low and flat ON-state resistance (ron) and an excellent ON-state resistance match. Low
input/output capacitance, high bandwidth, low skew, and low crosstalk among channels make this device suitable
for various LAN applications, such as 10/100/1000 Base-T. This device can be used to replace mechanical
relays in LAN applications. It also can be used to route signals from a 10/100 Base-T Ethernet transceiver to the
RJ-45 LAN connectors in laptops or in docking stations.
8.2 Functional Block Diagram
Figure 10. Logic Diagram (Positive Logic)
8.3 Feature Description
The TS3L501E device switches and pin out are optimized for ethernet application but the device can used for
many applications where a multi-channel, 1:2 SPDT, high bandwidth switch is needed.
8.4 Device Functional Modes
The TS3L501E supports a power down mode which reduces the current consumption of the device and places
all the signal paths in a high impedance state. To place the TS3L501E in power down mode, set the PD pin with
a logic high voltage as seen in Table 1.
Table 1. Function Table
PD SEL FUNCTION
L L Anto Bn, LED_Anto LED_Bn
L H Anto Cn, LED_Anto LED_Cn
H X Hi-Z
l TEXAS INSTRUMENTS
RJ45 Port 1
RJ45 Port 2
SEL
PD
Gigabit
Ethernet
PHY
Processor TS3L501E
VDD
GND
CN
BN
AN
GPIO
GPIO
7 7
7
LED 1
LED 2
LED_BN
LED_CN
LED_AN
2
2
2
GPIO
Copyright © 2016, Texas Instruments Incorporated
15
TS3L501E
www.ti.com
SCDS307C –SEPTEMBER 2010REVISED DECEMBER 2017
Product Folder Links: TS3L501E
Submit Documentation FeedbackCopyright © 2010–2017, Texas Instruments Incorporated
9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
There are many Local Area Network (LAN) applications in which the ethernet hubs or controllers have a limited
number of I/Os or need to route signals from a single ethernet PHY to multiple ethernet jacks. The TS3L501E
solution can effectively expand the limited I/Os by switching between multiple ethernet jacks to interface them to
a single ethernet PHY.
The LED_An, LED_Bn,and LED_Cnpins are rated the same as the other signal path pins so you may use these
pins as extra data paths if needed.
9.2 Typical Application
Figure 11. Typical Application Schematic
l TEXAS INSTRUMENTS
f - Frequency - Hz
Gain - dB
-16
-14
-12
-10
-8
-6
-4
-2
0
1.00E+06 10.00E+06 100.00E+06 1.00E+09 10.00E+09
16
TS3L501E
SCDS307C –SEPTEMBER 2010REVISED DECEMBER 2017
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Product Folder Links: TS3L501E
Submit Documentation Feedback Copyright © 2010–2017, Texas Instruments Incorporated
Typical Application (continued)
9.2.1 Design Requirements
Ensure that all of the signals passing through the switch are within the recommended operating ranges. To
ensure proper performance, see Recommended Operating Conditions.
9.2.2 Detailed Design Procedure
The TS3L501E can be properly operated without any external components.
TI recommends that the digital control pins SEL and PD be pulled up to VCC or down to GND to avoid undesired
switch positions that could result from the floating pin.
Connect the exposed thermal pad to ground.
9.2.3 Application Curve
Figure 12. Gain vs Frequency
l TEXAS INSTRUMENTS
Signal 1
GND Plane
Power Plane
Signal 2
17
TS3L501E
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SCDS307C –SEPTEMBER 2010REVISED DECEMBER 2017
Product Folder Links: TS3L501E
Submit Documentation FeedbackCopyright © 2010–2017, Texas Instruments Incorporated
10 Power Supply Recommendations
Power to the device is supplied through the VDD pins. TI recommends placing a bypass capacitor as close to the
supply pin (VCC) as possible to help smooth out lower frequency noise to provide better load regulation across
the frequency spectrum.
All VDD pins are internally connected. One PCB layout option is to connect one of the VDD to the power supply
and leave the other VDD pins open.
Supply the TS3L501E VDD pins with the recommended voltage before appling a signal voltage to the I/O signal
paths to avoid violating the recommended opperating condition I/O voltage 0-VDD
11 Layout
11.1 Layout Guidelines
TI recommends keeping the high-speed signals as short as possible.
Each via introduces discontinuities in the transmission line of the signal and increases the chance of picking
up interference from the other layers of the board. Be careful when designing test points on twisted pair lines;
through-hole pins are not recommended.
When it becomes necessary to turn 90°, use two 45° turns or an arc instead of making a single 90° turn. This
reduces reflections on the signal traces by minimizing impedance discontinuities.
Do not route traces under or near crystals, oscillators, clock signal generators, switching regulators, mounting
holes, magnetic devices or ICs that use or duplicate clock signals.
Avoid stubs on the high-speed signals because they cause signal reflections. If a stub is unavoidable, then
the stub must be less than 200 mm.
Route all high-speed signal traces over continuous GND planes, with no interruptions. Avoid crossing over
anti-etch, commonly found with plane splits.
Due to high-frequency signals, a printed-circuit board with at least four layers is recommended; two signal
layers separated by a ground and power layer as shown in Figure 13.
The majority of signal traces must run on a single layer, preferably Signal 1. Immediately next to this layer
should be the GND plane, which is solid with no cuts. Avoid running signal traces across a split in the ground
or power plane. When running across split planes is unavoidable, sufficient decoupling must be used.
Minimizing the number of signal vias reduces EMI by reducing inductance at high frequencies.
Figure 13. Four-Layer Board Stackup
{L} TEXAS INSTRUMENTS TTT J J J J J J J J L L L JJFJJJ FJFJJ FJJ
9
8
6
7
5
4
3
2
1
17
15
16
14
13
12
11
10
30
31
33
32
34
35
36
37
38
22
24
23
25
26
27
28
29
201918 21
404142 39
Exposed Center
Pad
(GND)
To System
To System
To System
To System
To System
To System
To System
To
System
To
System
To
System
To System
To System
To System
To System
To System
To System
To System
To System
To System
To
System
To
System
To
System
To System
To System
To System
To System
To System
To System
To System
To System
To System
To System
To System
To System
To System
To System
VDD
0603
18
TS3L501E
SCDS307C –SEPTEMBER 2010REVISED DECEMBER 2017
www.ti.com
Product Folder Links: TS3L501E
Submit Documentation Feedback Copyright © 2010–2017, Texas Instruments Incorporated
11.2 Layout Example
Figure 14. Layout Example
l TEXAS INSTRUMENTS
19
TS3L501E
www.ti.com
SCDS307C –SEPTEMBER 2010REVISED DECEMBER 2017
Product Folder Links: TS3L501E
Submit Documentation FeedbackCopyright © 2010–2017, Texas Instruments Incorporated
12 Device and Documentation Support
12.1 Documentation Support
12.1.1 Related Documentation
For related documentation, see the following:
Implications of Slow or Floating CMOS Inputs,SCBA004
12.2 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper
right corner, click on Alert me to register and receive a weekly digest of any product information that has
changed. For change details, review the revision history included in any revised document.
12.3 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
12.4 Trademarks
E2E is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
12.5 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
12.6 Glossary
SLYZ022 TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
I TEXAS INSTRUMENTS Samples
PACKAGE OPTION ADDENDUM
www.ti.com 10-Dec-2020
Addendum-Page 1
PACKAGING INFORMATION
Orderable Device Status
(1)
Package Type Package
Drawing Pins Package
Qty Eco Plan
(2)
Lead finish/
Ball material
(6)
MSL Peak Temp
(3)
Op Temp (°C) Device Marking
(4/5)
Samples
TS3L501ERUAR ACTIVE WQFN RUA 42 3000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 TK501E
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6) Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
I TEXAS INSTRUMENTS REEL DIMENSIONS TAPE DIMENSIONS 7 “K0 '«m» Reel Diame|er AD Dimension deswgned to accommodate the componem wwdlh E0 Dimension desxgned to accommodate the componenl \ength KO Dimenslun deswgned to accommodate the componem thickness 7 w OveraH wwdm loe earner cape i p1 Pitch between successwe cavuy cemers f T Reel Width (W1) QUADRANT ASSIGNMENTS FOR PIN 1 ORIENTATION IN TAPE O O O D O O D O Sprockemoles ,,,,,,,,,,, ‘ User Direcllon 0' Feed Pockel Quadrams
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device Package
Type Package
Drawing Pins SPQ Reel
Diameter
(mm)
Reel
Width
W1 (mm)
A0
(mm) B0
(mm) K0
(mm) P1
(mm) W
(mm) Pin1
Quadrant
TS3L501ERUAR WQFN RUA 42 3000 330.0 16.4 3.8 9.3 1.0 8.0 16.0 Q1
TS3L501ERUAR WQFN RUA 42 3000 330.0 16.4 3.8 9.3 1.0 8.0 16.0 Q1
PACKAGE MATERIALS INFORMATION
www.ti.com 15-Apr-2020
Pack Materials-Page 1
I TEXAS INSTRUMENTS TAPE AND REEL BOX DIMENSIONS
*All dimensions are nominal
Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
TS3L501ERUAR WQFN RUA 42 3000 358.0 335.0 35.0
TS3L501ERUAR WQFN RUA 42 3000 367.0 367.0 38.0
PACKAGE MATERIALS INFORMATION
www.ti.com 15-Apr-2020
Pack Materials-Page 2
www.ti.com
GENERIC PACKAGE VIEW
This image is a representation of the package family, actual package may vary.
Refer to the product data sheet for package details.
WQFN - 0.8 mm max heightRUA 42
PLASTIC QUAD FLATPACK - NO LEAD
9 x 3.5, 0.5 mm pitch
4226504/A
I 1 i :E 41+ , CCCCCCCCECCCCCCCC\ , [a Q ‘ 7 m \ i a 4 “73333333333333? ,TT , Vt Lrw r|m|L flfl
www.ti.com
PACKAGE OUTLINE
3.6
3.4
9.1
8.9
0.8
0.6
0.05
0.00
2X 8
38X 0.5
2X 1.5
42X 0.5
0.3
42X 0.3
0.2
7.55 0.1
2.05 0.1
(0.1) TYP
WQFN - 0.8 mm max heightRUA0042A
PLASTIC QUAD FLATPACK - NO LEAD
4219139/A 03/2020
0.08 C
0.1 C A B
0.05
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. The package thermal pad must be soldered to the printed circuit board for thermal and mechanical performance.
PIN 1 INDEX AREA
SEATING PLANE
PIN 1 ID
SYMM
EXPOSED
THERMAL PAD
SYMM
1
17
18 21
22
38
39
42
43
SCALE 1.800
A
B
C
/5 7 7 7,7,7 fig? Cpcho v (L EB@** L11 F: l 7 mfg? WEEEE , w‘l g 3F, 87 M Him ““7 o ”7 $$fi$%@$x\7 v7¢
www.ti.com
EXAMPLE BOARD LAYOUT
38X (0.5)
(R0.05) TYP
0.05 MAX
ALL AROUND
0.05 MIN
ALL AROUND
1.17 TYP
(0.775)
TYP
42X (0.6)
42X (0.25)
(3.3)
(8.8)(7.55)
(2.05)
( 0.2) TYP
VIA
(3.525) TYP
WQFN - 0.8 mm max heightRUA0042A
PLASTIC QUAD FLATPACK - NO LEAD
4219139/A 03/2020
NOTES: (continued)
4. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature
number SLUA271 (www.ti.com/lit/slua271).
5. Vias are optional depending on application, refer to device data sheet. If any vias are implemented, refer to their locations shown
on this view. It is recommended that vias under paste be filled, plugged or tented.
SYMM
SYMM
LAND PATTERN EXAMPLE
EXPOSED METAL SHOWN
SCALE: 10X
SEE SOLDER MASK
DETAIL
1
17
18 21
22
38
39
42
43
METAL EDGE
SOLDER MASK
OPENING
EXPOSED
METAL
METAL UNDER
SOLDER MASK
SOLDER MASK
OPENING
EXPOSED
METAL
NON SOLDER MASK
DEFINED
(PREFERRED)
SOLDER MASK DEFINED
SOLDER MASK DETAILS
fl 4 j * fl mmgfimmagmmfi Ev? “““ E 8+; x? H‘mjrfii mafia 7 E V E E E % flat? $¢$$$$$ “““ P
www.ti.com
EXAMPLE STENCIL DESIGN
12X (0.92)
12X (0.97)
(0.585)
TYP
(0.56) TYP
42X (0.6)
42X (0.25)
38X (0.5)
(3.3)
(8.8)
(R0.05) TYP
WQFN - 0.8 mm max heightRUA0042A
PLASTIC QUAD FLATPACK - NO LEAD
4219139/A 03/2020
NOTES: (continued)
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
SOLDER PASTE EXAMPLE
BASED ON 0.125 MM THICK STENCIL
SCALE: 12X
EXPOSED PAD 43
69% PRINTED SOLDER COVERAGE BY AREA UNDER PACKAGE
SYMM
SYMM
1
17
18 21
22
38
39
42
43
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