Datenblatt für TMUX1104 von Texas Instruments

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TMUX1104
S1
D1
S2
S3
S4
A0A1EN
1-of-4
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An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
TMUX1104
SCDS392B –NOVEMBER 2018REVISED JULY 2019
TMUX1104 5-V, Low-Leakage-Current, 4:1 Precision Multiplexer
1
1 Features
1 Wide supply range: 1.08 V to 5.5 V
Low leakage current: 3 pA
Low charge injection: 1.5 pC
Low on-resistance: 2 Ω
-40°C to +125°C Operating temperature
1.8 V Logic Compatible
Fail-Safe Logic
Rail to Rail Operation
Bidirectional Signal Path
Break-before-make switching
ESD protection HBM: 2000 V
2 Applications
Ultrasound scanners
Patient monitoring & diagnostics
Blood glucose monitors
Optical networking
Optical test equipment
Remote radio units
Wired networking
Data acquisition systems
ATE test equipment
Factory automation and industrial controls
Programmable logic controllers (PLC)
Analog input modules
SONAR receivers
Battery monitoring systems
3 Description
The TMUX1104 is a precision complementary metal-
oxide semiconductor (CMOS) multiplexer (MUX). The
TMUX1104 offers a single channel, 4:1 configuration.
Wide operating supply of 1.08 V to 5.5 V allows for
use in a broad array of applications from medical
equipment to industrial systems. The device supports
bidirectional analog and digital signals on the source
(Sx) and drain (D) pins ranging from GND to VDD. All
logic inputs have 1.8 V logic compatible thresholds,
ensuring both TTL and CMOS logic compatibility
when operating in the valid supply voltage range.
Fail-Safe Logic circuitry allows voltages on the control
pins to be applied before the supply pin, protecting
the device from potential damage.
The TMUX1104 is part of the precision switches and
multiplexers family of devices. These devices have
very low on and off leakage currents and low charge
injection, allowing them to be used in high precision
measurement applications. A low supply current of 5
nA and small package options enable use in portable
applications.
Device Information(1)
PART NUMBER PACKAGE BODY SIZE (NOM)
TMUX1104 VSSOP (10) (DGS) 3.00 mm × 3.00 mm
USON (10) (DQA) 2.50 mm x 1.00 mm
(1) For all available packages, see the package option addendum
at the end of the data sheet.
Simplified Schematic Block Diagram
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SCDS392B –NOVEMBER 2018REVISED JULY 2019
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Table of Contents
1 Features.................................................................. 1
2 Applications ........................................................... 1
3 Description ............................................................. 1
4 Revision History..................................................... 2
5 Pin Configuration and Functions......................... 3
6 Specifications......................................................... 4
6.1 Absolute Maximum Ratings ...................................... 4
6.2 ESD Ratings.............................................................. 4
6.3 Recommended Operating Conditions....................... 4
6.4 Thermal Information.................................................. 4
6.5 Electrical Characteristics (VDD = 5 V ±10 %)............ 5
6.6 Electrical Characteristics (VDD = 3.3 V ±10 %)......... 7
6.7 Electrical Characteristics (VDD = 1.8 V ±10 %)......... 9
6.8 Electrical Characteristics (VDD = 1.2 V ±10 %)....... 11
6.9 Typical Characteristics............................................ 13
7 Parameter Measurement Information ................ 16
7.1 On-Resistance ........................................................ 16
7.2 Off-Leakage Current ............................................... 16
7.3 On-Leakage Current ............................................... 17
7.4 Transition Time ....................................................... 17
7.5 Break-Before-Make................................................. 18
7.6 tON(EN) and tOFF(EN).................................................. 18
7.7 Charge Injection...................................................... 19
7.8 Off Isolation............................................................. 19
7.9 Crosstalk ................................................................. 20
7.10 Bandwidth ............................................................. 20
8 Detailed Description............................................ 21
8.1 Functional Block Diagram....................................... 21
8.2 Feature Description................................................. 21
8.3 Device Functional Modes........................................ 23
8.4 Truth Tables............................................................ 23
9 Application and Implementation ........................ 24
9.1 Application Information............................................ 24
9.2 Typical Application ................................................. 24
9.3 Design Requirements.............................................. 24
9.4 Detailed Design Procedure..................................... 25
9.5 Application Curve.................................................... 25
10 Power Supply Recommendations ..................... 25
11 Layout................................................................... 26
11.1 Layout Guidelines ................................................. 26
11.2 Layout Example .................................................... 26
12 Device and Documentation Support ................. 27
12.1 Documentation Support ........................................ 27
12.2 Receiving Notification of Documentation Updates 27
12.3 Community Resources.......................................... 27
12.4 Trademarks........................................................... 27
12.5 Electrostatic Discharge Caution............................ 27
12.6 Glossary................................................................ 27
13 Mechanical, Packaging, and Orderable
Information ........................................................... 27
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision A (December 2018) to Revision B Page
Deleted the Product Preview note from the DQA package in the Device Information table.................................................. 1
Deleted the Product Preview note from the DQA package in the Pin Configuration and Functions section......................... 3
Added DQA (USON) thermal values to Thermal Information ................................................................................................ 4
Changes from Original (November 2018) to Revision A Page
Changed the document status From: Advanced Information To: Production Mix data.......................................................... 1
l TEXAS INSTRUMENTS
1A0 10 A1
2S1 9 S2
3GND 8 D
4S3 7 S4
5EN 6 VDD
Not to scale
1A0 10 A1
2S1 9 S2
3GND 8 D
4S3 7 S4
5EN 6 VDD
Not to scale
3
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5 Pin Configuration and Functions
DGS Package
10-Pin VSSOP
Top View
DQA Package
10-Pin USON
Top View
(1) I = input, O = output, I/O = input and output, P = power
Pin Functions
PIN TYPE(1) DESCRIPTION
NAME DGS, DQA
A0 1 I Address line 0. Controls the switch configuration as shown in Table 1.
S1 2 I/O Source pin 1. Can be an input or output.
GND 3 P Ground (0 V) reference
S3 4 I/O Source pin 3. Can be an input or output.
EN 5 I Active high logic enable. When this pin is low, all switches are turned off. When this pin is high, the
A[1:0] logic inputs determine which switch is turned on.
VDD 6 P Positive power supply. This pin is the most positive power-supply potential. For reliable operation,
connect a decoupling capacitor ranging from 0.1 µF to 10 µF between VDD and GND.
S4 7 I/O Source pin 4. Can be an input or output.
D 8 I/O Drain pin. Can be an input or output.
S2 9 I/O Source pin 2. Can be an input or output.
A1 10 I Address line 1. Controls the switch configuration as shown in Table 1.
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SCDS392B –NOVEMBER 2018REVISED JULY 2019
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(1) Stresses beyond those listed under Absolute Maximum Rating may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Condition. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The algebraic convention, whereby the most negative value is a minimum and the most positive value is a maximum.
(3) All voltages are with respect to ground, unless otherwise specified.
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted) (1) (2) (3)
MIN MAX UNIT
VDD Supply voltage –0.5 6 V
VSEL or VEN Logic control input pin voltage (EN, A0, A1) –0.5 6 V
ISEL or IEN Logic control input pin current (EN, A0, A1) –30 30 mA
VSor VDSource or drain voltage (Sx, D) –0.5 VDD+0.5 V
ISor ID (CONT) Source or drain continuous current (Sx, D) –30 30 mA
Tstg Storage temperature –65 150 °C
TJJunction temperature 150 °C
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.2 ESD Ratings
VALUE UNIT
V(ESD) Electrostatic discharge
Human body model (HBM), per
ANSI/ESDA/JEDEC JS-001, all pins(1) ±2000
V
Charged device model (CDM), per JEDEC
specification JESD22-C101, all pins(2) ±750
6.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN NOM MAX UNIT
VDD Positive power supply voltage 1.08 5.5 V
VSor VDSignal path input/output voltage (source or drain pin) (Sx, D) 0 VDD V
VSEL or
VEN Logic control input pin voltage 0 5.5 V
TAAmbient temperature –40 125 °C
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
6.4 Thermal Information
THERMAL METRIC(1)
TMUX1104
UNITDGS (VSSOP) DQA (USON)
10 PINS 10 PINS
RθJA Junction-to-ambient thermal resistance 193.9 173.0 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 83.1 99.7 °C/W
RθJB Junction-to-board thermal resistance 116.5 73.5 °C/W
ΨJT Junction-to-top characterization parameter 22.0 8.9 °C/W
ΨJB Junction-to-board characterization parameter 114.6 73.0 °C/W
RθJC(bot) Junction-to-case (bottom) thermal resistance N/A N/A °C/W
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(1) When VSis 4.5 V, VDis 1.5 V, and vice versa.
6.5 Electrical Characteristics (VDD = 5 V ±10 %)
at TA= 25°C, VDD = 5 V (unless otherwise noted)
PARAMETER TEST CONDITIONS TA MIN TYP MAX UNIT
ANALOG SWITCH
RON On-resistance VS= 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C 2 4 Ω
–40°C to +85°C 4.5 Ω
–40°C to +125°C 4.9 Ω
ΔRON On-resistance matching between
channels
VS= 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C 0.13 Ω
–40°C to +85°C 0.4 Ω
–40°C to +125°C 0.5 Ω
RON
FLAT On-resistance flatness VS= 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C 0.85 Ω
–40°C to +85°C 1.6 Ω
–40°C to +125°C 1.6 Ω
IS(OFF) Source off leakage current(1)
VDD = 5 V
Switch Off
VD= 4.5 V / 1.5 V
VS= 1.5 V / 4.5 V
Refer to Off-Leakage Current
25°C –0.08 ±0.005 0.08 nA
–40°C to +85°C –0.3 0.3 nA
–40°C to +125°C –0.9 0.9 nA
ID(OFF) Drain off leakage current(1)
VDD = 5 V
Switch Off
VD= 4.5 V / 1.5 V
VS= 1.5 V / 4.5 V
Refer to Off-Leakage Current
25°C –0.1 ±0.01 0.1 nA
–40°C to +85°C –0.75 0.75 nA
–40°C to +125°C –3.5 3.5 nA
ID(ON)
IS(ON) Channel on leakage current
VDD = 5 V
Switch On
VD= VS= 2.5 V
Refer to On-Leakage Current
25°C –0.025 ±0.003 0.025 nA
–40°C to +85°C –0.3 0.3 nA
–40°C to +125°C –0.95 0.95 nA
ID(ON)
IS(ON) Channel on leakage current
VDD = 5 V
Switch On
VD= VS= 4.5 V / 1.5 V
Refer to On-Leakage Current
25°C –0.1 ±0.01 0.1 nA
–40°C to +85°C –0.75 0.75 nA
–40°C to +125°C –3.5 3.5 nA
LOGIC INPUTS (EN, A0, A1)
VIH Input logic high –40°C to +125°C 1.49 5.5 V
VIL Input logic low –40°C to +125°C 0 0.87 V
IIH
IIL Input leakage current 25°C ±0.005 µA
IIH
IIL Input leakage current –40°C to +125°C ±0.05 µA
CIN Logic input capacitance 25°C 1 pF
CIN Logic input capacitance –40°C to +125°C 2 pF
POWER SUPPLY
IDD VDD supply current Logic inputs = 0 V or 5.5 V 25°C 0.005 µA
–40°C to +125°C 1 µA
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Electrical Characteristics (VDD = 5 V ±10 %) (continued)
at TA= 25°C, VDD = 5 V (unless otherwise noted)
PARAMETER TEST CONDITIONS TA MIN TYP MAX UNIT
DYNAMIC CHARACTERISTICS
tTRAN Transition time between channels VS= 3 V
RL= 200 , CL= 15 pF
Refer to Transition Time
25°C 14 ns
–40°C to +85°C 18 ns
–40°C to +125°C 19 ns
tOPEN
(BBM) Break before make time VS= 3 V
RL= 200 , CL= 15 pF
Refer to Break-Before-Make
25°C 8 ns
–40°C to +85°C 1 ns
–40°C to +125°C 1 ns
tON(EN) Enable turn-on time VS= 3 V
RL= 200 , CL= 15 pF
Refer to tON(EN) and tOFF(EN)
25°C 12 ns
–40°C to +85°C 17 ns
–40°C to +125°C 18 ns
tOFF(EN) Enable turn-off time VS= 3 V
RL= 200 , CL= 15 pF
Refer to tON(EN) and tOFF(EN)
25°C 5 ns
–40°C to +85°C 8 ns
–40°C to +125°C 9 ns
QCCharge Injection VS= 1 V
RS= 0 , CL= 1 nF
Refer to Charge Injection 25°C 1.5 pC
OISO Off Isolation
RL= 50 , CL= 5 pF
f = 1 MHz
Refer to Off Isolation 25°C –65 dB
RL= 50 , CL= 5 pF
f = 10 MHz
Refer to Off Isolation 25°C –45 dB
XTALK Crosstalk
RL= 50 , CL= 5 pF
f = 1 MHz
Refer to Crosstalk 25°C –65 dB
RL= 50 , CL= 5 pF
f = 10 MHz
Refer to Crosstalk 25°C –45 dB
BW Bandwidth RL= 50 , CL= 5 pF
Refer to Bandwidth 25°C 155 MHz
CSOFF Source off capacitance f = 1 MHz 25°C 6 pF
CDOFF Drain off capacitance f = 1 MHz 25°C 28 pF
CSON
CDON On capacitance f = 1 MHz 25°C 35 pF
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(1) When VSis 3 V, VDis 1 V, and vice versa.
6.6 Electrical Characteristics (VDD = 3.3 V ±10 %)
at TA= 25°C, VDD = 3.3 V (unless otherwise noted)
PARAMETER TEST CONDITIONS TA MIN TYP MAX UNIT
ANALOG SWITCH
RON On-resistance VS= 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C 3.7 8.8 Ω
–40°C to +85°C 9.5 Ω
–40°C to +125°C 9.8 Ω
ΔRON On-resistance matching between
channels
VS= 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C 0.13 Ω
–40°C to +85°C 0.4 Ω
–40°C to +125°C 0.5 Ω
RON
FLAT On-resistance flatness VS= 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C 1.9 Ω
–40°C to +85°C 2 Ω
–40°C to +125°C 2.2 Ω
IS(OFF) Source off leakage current(1)
VDD = 3.3 V
Switch Off
VD= 3 V / 1 V
VS= 1 V / 3 V
Refer to Off-Leakage Current
25°C –0.05 ±0.001 0.05 nA
–40°C to +85°C –0.1 0.1 nA
–40°C to +125°C –0.5 0.5 nA
ID(OFF) Drain off leakage current(1)
VDD = 3.3 V
Switch Off
VD= 3 V / 1 V
VS= 1 V / 3 V
Refer to Off-Leakage Current
25°C –0.1 ±0.005 0.1 nA
–40°C to +85°C –0.5 0.5 nA
–40°C to +125°C –2 2 nA
ID(ON)
IS(ON) Channel on leakage current
VDD = 3.3 V
Switch On
VD= VS= 3 V / 1 V
Refer to On-Leakage Current
25°C –0.1 ±0.005 0.1 nA
–40°C to +85°C –0.5 0.5 nA
–40°C to +125°C –2 2 nA
LOGIC INPUTS (EN, A0, A1)
VIH Input logic high –40°C to +125°C 1.35 5.5 V
VIL Input logic low –40°C to +125°C 0 0.8 V
IIH
IIL Input leakage current 25°C ±0.005 µA
IIH
IIL Input leakage current –40°C to +125°C ±0.05 µA
CIN Logic input capacitance 25°C 1 pF
CIN Logic input capacitance –40°C to +125°C 2 pF
POWER SUPPLY
IDD VDD supply current Logic inputs = 0 V or 5.5 V 25°C 0.005 µA
–40°C to +125°C 1 µA
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Electrical Characteristics (VDD = 3.3 V ±10 %) (continued)
at TA= 25°C, VDD = 3.3 V (unless otherwise noted)
PARAMETER TEST CONDITIONS TA MIN TYP MAX UNIT
DYNAMIC CHARACTERISTICS
tTRAN Transition time between channels VS= 2 V
RL= 200 , CL= 15 pF
Refer to Transition Time
25°C 15 ns
–40°C to +85°C 21 ns
–40°C to +125°C 22 ns
tOPEN
(BBM) Break before make time VS= 2 V
RL= 200 , CL= 15 pF
Refer to Break-Before-Make
25°C 9 ns
–40°C to +85°C 1 ns
–40°C to +125°C 1 ns
tON(EN) Enable turn-on time VS= 2 V
RL= 200 , CL= 15 pF
Refer to tON(EN) and tOFF(EN)
25°C 14 ns
–40°C to +85°C 21 ns
–40°C to +125°C 21 ns
tOFF(EN) Enable turn-off time VS= 2 V
RL= 200 , CL= 15 pF
Refer to tON(EN) and tOFF(EN)
25°C 7 ns
–40°C to +85°C 9 ns
–40°C to +125°C 10 ns
QCCharge Injection VS= 1 V
RS= 0 , CL= 1 nF
Refer to Charge Injection 25°C –1.5 pC
OISO Off Isolation
RL= 50 , CL= 5 pF
f = 1 MHz
Refer to Off Isolation 25°C –65 dB
RL= 50 , CL= 5 pF
f = 10 MHz
Refer to Off Isolation 25°C –45 dB
XTALK Crosstalk
RL= 50 , CL= 5 pF
f = 1 MHz
Refer to Crosstalk 25°C –65 dB
RL= 50 , CL= 5 pF
f = 10 MHz
Refer to Crosstalk 25°C –45 dB
BW Bandwidth RL= 50 , CL= 5 pF
Refer to Bandwidth 25°C 155 MHz
CSOFF Source off capacitance f = 1 MHz 25°C 6 pF
CDOFF Drain off capacitance f = 1 MHz 25°C 28 pF
CSON
CDON On capacitance f = 1 MHz 25°C 35 pF
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(1) When VSis 1.62 V, VDis 1 V, and vice versa.
6.7 Electrical Characteristics (VDD = 1.8 V ±10 %)
at TA= 25°C, VDD = 1.8 V (unless otherwise noted)
PARAMETER TEST CONDITIONS TA MIN TYP MAX UNIT
ANALOG SWITCH
RON On-resistance VS= 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C 40 Ω
–40°C to +85°C 80 Ω
–40°C to +125°C 80 Ω
ΔRON On-resistance matching between
channels
VS= 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C 0.4 Ω
–40°C to +85°C 1.5 Ω
–40°C to +125°C 1.5 Ω
IS(OFF) Source off leakage current(1)
VDD = 1.98 V
Switch Off
VD= 1.62 V / 1 V
VS= 1 V / 1.62 V
Refer to Off-Leakage Current
25°C –0.05 ±0.003 0.05 nA
–40°C to +85°C –0.1 0.1 nA
–40°C to +125°C –0.5 0.5 nA
ID(OFF) Drain off leakage current(1)
VDD = 1.98 V
Switch Off
VD= 1.62 V / 1 V
VS= 1 V / 1.62 V
Refer to Off-Leakage Current
25°C –0.1 ±0.005 0.1 nA
–40°C to +85°C –0.5 0.5 nA
–40°C to +125°C –2 2 nA
ID(ON)
IS(ON) Channel on leakage current
VDD = 1.98 V
Switch On
VD= VS= 1.62 V / 1 V
Refer to On-Leakage Current
25°C –0.1 ±0.005 0.1 nA
–40°C to +85°C –0.5 0.5 nA
–40°C to +125°C –2 2 nA
LOGIC INPUTS (EN, A0, A1)
VIH Input logic high –40°C to +125°C 1.07 5.5 V
VIL Input logic low –40°C to +125°C 0 0.68 V
IIH
IIL Input leakage current 25°C ±0.005 µA
IIH
IIL Input leakage current –40°C to +125°C ±0.05 µA
CIN Logic input capacitance 25°C 1 pF
CIN Logic input capacitance –40°C to +125°C 2 pF
POWER SUPPLY
IDD VDD supply current Logic inputs = 0 V or 5.5 V 25°C 0.001 µA
–40°C to +125°C 0.85 µA
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Electrical Characteristics (VDD = 1.8 V ±10 %) (continued)
at TA= 25°C, VDD = 1.8 V (unless otherwise noted)
PARAMETER TEST CONDITIONS TA MIN TYP MAX UNIT
DYNAMIC CHARACTERISTICS
tTRAN Transition time between channels VS= 1 V
RL= 200 , CL= 15 pF
Refer to Transition Time
25°C 28 ns
–40°C to +85°C 44 ns
–40°C to +125°C 44 ns
tOPEN
(BBM) Break before make time VS= 1 V
RL= 200 , CL= 15 pF
Refer to Break-Before-Make
25°C 16 ns
–40°C to +85°C 1 ns
–40°C to +125°C 1 ns
tON(EN) Enable turn-on time VS= 1 V
RL= 200 , CL= 15 pF
Refer to tON(EN) and tOFF(EN)
25°C 25 ns
–40°C to +85°C 41 ns
–40°C to +125°C 41 ns
tOFF(EN) Enable turn-off time VS= 1 V
RL= 200 , CL= 15 pF
Refer to tON(EN) and tOFF(EN)
25°C 13 ns
–40°C to +85°C 23 ns
–40°C to +125°C 23 ns
QCCharge Injection VS= 1 V
RS= 0 , CL= 1 nF
Refer to Charge Injection 25°C –0.5 pC
OISO Off Isolation
RL= 50 , CL= 5 pF
f = 1 MHz
Refer to Off Isolation 25°C –65 dB
RL= 50 , CL= 5 pF
f = 10 MHz
Refer to Off Isolation 25°C –45 dB
XTALK Crosstalk
RL= 50 , CL= 5 pF
f = 1 MHz
Refer to Crosstalk 25°C –65 dB
RL= 50 , CL= 5 pF
f = 10 MHz
Refer to Crosstalk 25°C –45 dB
BW Bandwidth RL= 50 , CL= 5 pF
Refer to Bandwidth 25°C 140 MHz
CSOFF Source off capacitance f = 1 MHz 25°C 6 pF
CDOFF Drain off capacitance f = 1 MHz 25°C 28 pF
CSON
CDON On capacitance f = 1 MHz 25°C 35 pF
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(1) When VSis 1 V, VDis 0.8 V, and vice versa.
6.8 Electrical Characteristics (VDD = 1.2 V ±10 %)
PARAMETER TEST CONDITIONS TA MIN TYP MAX UNIT
ANALOG SWITCH
RON On-resistance VS= 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C 70 Ω
–40°C to +85°C 105 Ω
–40°C to +125°C 105 Ω
ΔRON On-resistance matching between
channels
VS= 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C 0.4 Ω
–40°C to +85°C 1.5 Ω
–40°C to +125°C 1.5 Ω
IS(OFF) Source off leakage current(1)
VDD = 1.32 V
Switch Off
VD= 1 V / 0.8 V
VS= 0.8 V / 1 V
Refer to Off-Leakage Current
25°C –0.05 ±0.003 0.05 nA
–40°C to +85°C –0.1 0.1 nA
–40°C to +125°C –0.5 0.5 nA
ID(OFF) Drain off leakage current(1)
VDD = 1.32 V
Switch Off
VD= 1 V / 0.8 V
VS= 0.8 V / 1 V
Refer to Off-Leakage Current
25°C –0.1 ±0.005 0.1 nA
–40°C to +85°C –0.5 0.5 nA
–40°C to +125°C –2 2 nA
ID(ON)
IS(ON) Channel on leakage current
VDD = 1.32 V
Switch On
VD= VS= 1 V / 0.8 V
Refer to On-Leakage Current
25°C –0.1 ±0.005 0.1 nA
–40°C to +85°C –0.5 0.5 nA
–40°C to +125°C –2 2 nA
LOGIC INPUTS (EN, A0, A1)
VIH Input logic high –40°C to +125°C 0.96 5.5 V
VIL Input logic low –40°C to +125°C 0 0.36 V
IIH
IIL Input leakage current 25°C ±0.005 µA
IIH
IIL Input leakage current –40°C to +125°C ±0.05 µA
CIN Logic input capacitance 25°C 1 pF
CIN Logic input capacitance –40°C to +125°C 2 pF
POWER SUPPLY
IDD VDD supply current Logic inputs = 0 V or 5.5 V 25°C 0.001 µA
–40°C to +125°C 0.7 µA
l TEXAS INSTRUMENTS
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Electrical Characteristics (VDD = 1.2 V ±10 %) (continued)
PARAMETER TEST CONDITIONS TA MIN TYP MAX UNIT
DYNAMIC CHARACTERISTICS
tTRAN Transition time between channels VS= 1 V
RL= 200 , CL= 15 pF
Refer to Transition Time
25°C 55 ns
–40°C to +85°C 190 ns
–40°C to +125°C 190 ns
tOPEN
(BBM) Break before make time VS= 1 V
RL= 200 , CL= 15 pF
Refer to Break-Before-Make
25°C 28 ns
–40°C to +85°C 1 ns
–40°C to +125°C 1 ns
tON(EN) Enable turn-on time VS= 1 V
RL= 200 , CL= 15 pF
Refer to tON(EN) and tOFF(EN)
25°C 50 ns
–40°C to +85°C 175 ns
–40°C to +125°C 175 ns
tOFF(EN) Enable turn-off time VS= 1 V
RL= 200 , CL= 15 pF
Refer to tON(EN) and tOFF(EN)
25°C 35 ns
–40°C to +85°C 135 ns
–40°C to +125°C 135 ns
QCCharge Injection VS= 1 V
RS= 0 , CL= 1 nF
Refer to Charge Injection 25°C –0.5 pC
OISO Off Isolation
RL= 50 , CL= 5 pF
f = 1 MHz
Refer to Off Isolation 25°C –65 dB
RL= 50 , CL= 5 pF
f = 10 MHz
Refer to Off Isolation 25°C –45 dB
XTALK Crosstalk
RL= 50 , CL= 5 pF
f = 1 MHz
Refer to Crosstalk 25°C –65 dB
RL= 50 , CL= 5 pF
f = 10 MHz
Refer to Crosstalk 25°C –45 dB
BW Bandwidth RL= 50 , CL= 5 pF
Refer to Bandwidth 25°C 125 MHz
CSOFF Source off capacitance f = 1 MHz 25°C 7 pF
CDOFF Drain off capacitance f = 1 MHz 25°C 32 pF
CSON
CDON On capacitance f = 1 MHz 25°C 40 pF
l TEXAS INSTRUMENTS H 14)? // W 400
VS or VD - Source or Drain Voltage (V)
On-Leakage (pA)
0 1 2 3 4 5
-400
-300
-200
-100
0
100
200
300
400
D006
VS or VD - Source or Drain Voltage (V)
On Resistance (:)
0 0.5 1 1.5 2 2.5 3 3.5
0
1
2
3
4
5
6
7
8
TA = 25qC
TA = 125qC
TA = 85qC
TA = -40qC
D003
VS or VD - Source or Drain Voltage (V)
On Resistance (:)
0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2
0
10
20
30
40
50
60
70
80
VDD = 1.62 V
VDD = 1.98 V
VDD = 1.08 V
VDD = 1.32 V
D004
VS or VD - Source or Drain Voltage (V)
On Resistance (:)
0 1 2 3 4 5 5.5
0
1
2
3
4
5
6
VDD = 5.5 V
VDD = 4.5 V
VDD = 3.63 V
VDD = 3 V
D001
VS or VD - Source or Drain Voltage (V)
On Resistance (:)
0 1 2 3 4 5
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
5
TA = 125qC
TA = 25qC
TA = 85qC
TA = -40qC
D002
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6.9 Typical Characteristics
at TA= 25°C, VDD = 5 V (unless otherwise noted)
TA= 25°C
Figure 1. On-Resistance vs Source or Drain Voltage
VDD = 5 V
Figure 2. On-Resistance vs Temperature
VDD = 3.3 V
Figure 3. On-Resistance vs Temperature
TA= 25°C
Figure 4. On-Resistance vs Source or Drain Voltage
TA= 25°C
Figure 5. On-Leakage vs Source or Drain Voltage
VDD = 5 V
Figure 6. On-Leakage vs Source or Drain Voltage
l TEXAS INSTRUMENTS D4 1400
VS - Source Voltage (V)
Charge Injection (pC)
0 1 2 3 4 5
-20
-15
-10
-5
0
5
10
15
20
VDD = 5 V
VDD = 3.3 V
D011
VS - Source Voltage (V)
Charge Injection (pC)
0 0.5 1 1.5 2
-5
-3
-1
1
3
5
VDD = 1.8 V
VDD = 1.2 V
D012
Temperature (qC)
Supply Current (PA)
-40 -20 0 20 40 60 80 100 120 140
-0.1
0
0.1
0.2
0.3
0.4
VDD = 5 V
VDD = 3.3 V
VDD = 1.8 V
VDD = 1.2 V
D009
Logic Voltage (V)
Supply Current (PA)
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5
0
200
400
600
800
1000
1200
1400
VDD = 5 VVDD = 3.3 V
D010
Temperature (qC)
Leakage Current (nA)
-40 -20 0 20 40 60 80 100 120
-1
-0.75
-0.5
-0.25
0
0.25
0.5
0.75
1
ID(OFF)
I(ON)
IS(OFF)
D007
Temperature (qC)
Leakage Current (nA)
-40 -20 0 20 40 60 80 100 120
-3.5
-2.5
-1.5
-0.5
0.5
1.5
2.5
3.5
I(ON)
ID(OFF)
IS(OFF)
D008
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Typical Characteristics (continued)
VDD = 3.3 V
Figure 7. Leakage Current vs Temperature
VDD = 5 V
Figure 8. Leakage Current vs Temperature
VSEL = 5.5 V
Figure 9. Supply Current vs Temperature
TA= 25°C
Figure 10. Supply Current vs Logic Voltage
TA= -40°C to 125°C
Figure 11. Charge Injection vs Source Voltage
TA= -40°C to 125°C
Figure 12. Charge Injection vs Source Voltage
l TEXAS INSTRUMENTS
Frequency (Hz)
Gain (dB)
-6
-5
-4
-3
-2
-1
0
1M 10M 100M
D017
VDD - Supply Voltage (V)
Time (ns)
0.5 1.5 2.5 3.5 4.5 5.5
0
5
10
15
20
25
30
FALLING
RISING
D015
Frequency (Hz)
Magnitude (dB)
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
100k 1M 10M 100M
D016
VDD - Supply Voltage (V)
Time (ns)
1.5 2 2.5 3 3.5 4 4.5 5 5.5
3
6
9
12
15
18
21
24
27
30
TOFF(EN)
TON(EN)
D013
Temperature (qC)
Time (ns)
-60 -30 0 30 60 90 120 150
0
4
8
12
16
20
TOFF(EN)
TON(EN)
D014
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Typical Characteristics (continued)
TA= 25°C
Figure 13. TON (EN) and TOFF (EN) vs Supply Voltage
VDD = 5 V
Figure 14. TON (EN) and TOFF (EN) vs Temperature
TA= 25°C
Figure 15. Output TTRANSITION vs Supply Voltage
TA= 25°C
Figure 16. Xtalk and Off-Isolation vs Frequency
TA= 25°C
Figure 17. On Response vs Frequency
dflwi \
VDD
VDD
S1
S2
GND
VS
S4
D
VD
A
ID (OFF)
VDD
VDD
S1
S2
GND
VS
S4
D
VD
A
Is (OFF)
S3
S3
V
D
VS
ISD
Sx
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7 Parameter Measurement Information
7.1 On-Resistance
The on-resistance of a device is the ohmic resistance between the source (Sx) and drain (D) pins of the device.
The on-resistance varies with input voltage and supply voltage. The symbol RON is used to denote on-resistance.
The measurement setup used to measure RON is shown in Figure 18. Voltage (V) and current (ISD) are measured
using this setup, and RON is computed with RON =V/ISD:
Figure 18. On-Resistance Measurement Setup
7.2 Off-Leakage Current
There are two types of leakage currents associated with a switch during the off state:
1. Source off-leakage current
2. Drain off-leakage current
Source leakage current is defined as the leakage current flowing into or out of the source pin when the switch is
off. This current is denoted by the symbol IS(OFF).
Drain leakage current is defined as the leakage current flowing into or out of the drain pin when the switch is off.
This current is denoted by the symbol ID(OFF).
The setup used to measure both off-leakage currents is shown in Figure 19.
Figure 19. Off-Leakage Measurement Setup
VIH VIL
tTRANSITION
10%
90%
OUTPUT
0 V
ADDRESS
DRIVE
(VSEL)
VDD
tTRANSITION
VS
OUTPUT
RLCL
A0
A1
D
GND
VSEL
0 V
tr < 5ns tf < 5ns
VDD
VDD
0.1F
S2
S1
S3
S4
VDD
VDD
S1
S2
GND
VS
S4
D
VD
ID (ON)
VDD
VDD
S1
S2
GND
VS
S8
D
Vs
A
IS (ON)
N.C.
N.C.
A
S3
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7.3 On-Leakage Current
Source on-leakage current is defined as the leakage current flowing into or out of the source pin when the switch
is on. This current is denoted by the symbol IS(ON).
Drain on-leakage current is defined as the leakage current flowing into or out of the drain pin when the switch is
on. This current is denoted by the symbol ID(ON).
Either the source pin or drain pin is left floating during the measurement. Figure 20 shows the circuit used for
measuring the on-leakage current, denoted by IS(ON) or ID(ON).
Figure 20. On-Leakage Measurement Setup
7.4 Transition Time
Transition time is defined as the time taken by the output of the device to rise or fall 10% after the address signal
has risen or fallen past the logic threshold. The 10% transition measurement is utilized to provide the timing of
the device. System level timing can then account for the time constant added from the load resistance and load
capacitance. Figure 21 shows the setup used to measure transition time, denoted by the symbol tTRANSITION.
Figure 21. Transition-Time Measurement Setup
EN A0
A1
GND
VEN
VDD
0 V
ENABLE
DRIVE
(VEN)VIH
VIL
tON (EN) tOFF (EN)
90%
10%
OUTPUT
0 V
tr < 5ns tf < 5ns
VDD
VDD
0.1F
VS
OUTPUT
RLCL
D
S2
S3
S4
VDD
0 V
tBBM 1
90%
Output
0 V
tOPEN (BBM) = min ( tBBM 1, tBBM 2)
tBBM 2
ADDRESS
DRIVE
(VSEL)tr < 5ns tf < 5ns
A0
A1
GND
VSEL
VDD
VDD
0.1F
VS
OUTPUT
RLCL
D
S2
S3
S4
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7.5 Break-Before-Make
Break-before-make delay is a safety feature that prevents two inputs from connecting when the device is
switching. The output first breaks from the on-state switch before making the connection with the next on-state
switch. The time delay between the break and the make is known as break-before-make delay. Figure 22 shows
the setup used to measure break-before-make delay, denoted by the symbol tOPEN(BBM).
Figure 22. Break-Before-Make Delay Measurement Setup
7.6 tON(EN) and tOFF(EN)
Turn-on time is defined as the time taken by the output of the device to rise to 10% after the enable has risen
past the logic threshold. The 10% measurement is utilized to provide the timing of the device. System level
timing can then account for the time constant added from the load resistance and load capacitance. Figure 23
shows the setup used to measure turn-on time, denoted by the symbol tON(EN).
Turn-off time is defined as the time taken by the output of the device to fall to 90% after the enable has fallen
past the logic threshold. The 90% measurement is utilized to provide the timing of the device. System level
timing can then account for the time constant added from the load resistance and load capacitance. Figure 23
shows the setup used to measure turn-off time, denoted by the symbol tOFF(EN).
Figure 23. Turn-On and Turn-Off Time Measurement Setup
OUT
S
V
Off Isolation 20 Log V
§ ·
˜ ¨ ¸
© ¹
GND
NETWORK
ANALYZER
VOUT
S
D
50Q
VSIG
RL
50Q
SX
RL
50Q
VS
VDD
0.1µF
OUTPUT
CL
EN
GND
VOUT
Output
VS
0 V
VDD
QC = CL × VOUT
VOUT
VEN
VDD
VDD
0.1F
A0
A1
VS
D
S2
S3
S4
VEN
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7.7 Charge Injection
The TMUX1104 has a transmission-gate topology. Any mismatch in capacitance between the NMOS and PMOS
transistors results in a charge injected into the drain or source during the falling or rising edge of the gate signal.
The amount of charge injected into the source or drain of the device is known as charge injection, and is denoted
by the symbol QC.Figure 24 shows the setup used to measure charge injection from source (Sx) to drain (D).
Figure 24. Charge-Injection Measurement Setup
7.8 Off Isolation
Off isolation is defined as the ratio of the signal at the drain pin (D) of the device when a signal is applied to the
source pin (Sx) of an off-channel. Figure 25 shows the setup used to measure, and the equation used to
calculate off isolation.
Figure 25. Off Isolation Measurement Setup
(1)
l TEXAS INSTRUMENTS {7+
GND
NETWORK
ANALYZER
VOUT
S
D
50Q
VSIG
RL
50Q
VS
VDD
0.1µF
SX
RL
50Q
OUT
S
V
Channel-to-Channel Crosstalk 20 Log V
§ ·
˜ ¨ ¸
© ¹
NETWORK
ANALYZER
GND
S1
S2
VSIG
50Q
VOUT
RL
50Q
RL
D
SX
50Q
50Q
RL
VS
VDD
0.1µF
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7.9 Crosstalk
Crosstalk is defined as the ratio of the signal at the drain pin (D) of a different channel, when a signal is applied
at the source pin (Sx) of an on-channel. Figure 26 shows the setup used to measure, and the equation used to
calculate crosstalk.
Figure 26. Crosstalk Measurement Setup
(2)
7.10 Bandwidth
Bandwidth is defined as the range of frequencies that are attenuated by less than 3 dB when the input is applied
to the source pin (Sx) of an on-channel, and the output is measured at the drain pin (D) of the device. Figure 27
shows the setup used to measure bandwidth.
Figure 27. Bandwidth Measurement Setup
l TEXAS INSTRUMENTS
TMUX1104
S1
D1
S2
S3
S4
A0A1EN
1-of-4
Decoder
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8 Detailed Description
8.1 Functional Block Diagram
The TMUX1104 is an 4:1, 1-channel (single-ended) multiplexer or demultiplexer. Each input is turned on or
turned off based on the state of the address lines and enable pin.
Figure 28. TMUX1104 Functional Block Diagram
8.2 Feature Description
8.2.1 Bidirectional Operation
The TMUX1104 conducts equally well from source (Sx) to drain (Dx) or from drain (Dx) to source (Sx). Each
channel has very similar characteristics in both directions and supports both analog and digital signals.
8.2.2 Rail to Rail Operation
The valid signal path input/output voltage for TMUX1104 ranges from GND to VDD.
8.2.3 1.8 V Logic Compatible Inputs
The TMUX1104 has 1.8-V logic compatible control for all logic control inputs. The logic input thresholds scale
with supply but still provide 1.8-V logic control when operating at 5.5 V supply voltage. 1.8-V logic level inputs
allows the TMUX1104 to interface with processors that have lower logic I/O rails and eliminates the need for an
external translator, which saves both space and BOM cost. For more information on 1.8 V logic implementations
refer to Simplifying Design with 1.8 V logic Muxes and Switches
8.2.4 Fail-Safe Logic
The TMUX1104 supports Fail-Safe Logic on the control input pins (EN, A0, A1) allowing for operation up to 5.5
V, regardless of the state of the supply pin. This feature allows voltages on the control pins to be applied before
the supply pin, protecting the device from potential damage. Fail-Safe Logic minimizes system complexity by
removing the need for power supply sequencing on the logic control pins. For example, the Fail-Safe Logic
feature allows the select pins of the TMUX1104 to be ramped to 5.5 V while VDD = 0 V. Additionally, the feature
enables operation of the TMUX1104 with VDD = 1.2 V while allowing the select pins to interface with a logic level
of another device up to 5.5 V.
l TEXAS INSTRUMENTS
SD
CGDP
CGDN
CGSN
CGSP
OFF ON
OFF ON
Temperature (qC)
Leakage Current (nA)
-40 -20 0 20 40 60 80 100 120
-3.5
-2.5
-1.5
-0.5
0.5
1.5
2.5
3.5
I(ON)
ID(OFF)
IS(OFF)
D008
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Feature Description (continued)
8.2.5 Ultra-low Leakage Current
The TMUX1104 provides extremely low on-leakage and off-leakage currents. The TMUX1104 is capable of
switching signals from high source-impedance inputs into a high input-impedance op amp with minimal offset
error because of the ultra-low leakage currents. Figure 29 shows typical leakage currents of the TMUX1104
versus temperature.
Figure 29. Leakage Current vs Temperature
8.2.6 Ultra-low Charge Injection
The TMUX1104 has a transmission gate topology, as shown in Figure 30. Any mismatch in the stray capacitance
associated with the NMOS and PMOS causes an output level change whenever the switch is opened or closed.
Figure 30. Transmission Gate Topology
l TEXAS INSTRUMENTS
VS - Source Voltage (V)
Charge Injection (pC)
0 1 2 3 4 5
-20
-15
-10
-5
0
5
10
15
20
VDD = 5 V
VDD = 3.3 V
D011
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Feature Description (continued)
The TMUX1104 has special charge-injection cancellation circuitry that reduces the source-to-drain charge
injection to 1.5 pC at VS= 1 V as shown in Figure 31.
Figure 31. Charge Injection vs Source Voltage
8.3 Device Functional Modes
When the EN pin of the TMUX1104 is pulled high, one of the switches is closed based on the state of the
address lines. When the EN pin is pulled low, all the switches are in an open state regardless of the state of the
address lines. The control pins can be as high as 5.5 V.
8.4 Truth Tables
Table 1 show the truth tables for the TMUX1104.
(1) X denotes don't care.
Table 1. TMUX1104 Truth Table
EN A1 A0 Selected Input Connected To Drain (D) Pin
0 X(1) X(1) All channels are off
1 0 0 S1
1 0 1 S2
1 1 0 S3
1 1 1 S4
l TEXAS INSTRUMENTS
Analog Inputs
LED Photo
Detector
Bridge Sensor
Thermocouple
Current
Sensing
Optical Sensor
...
Gain / Filter
Network
OPA333
-
+
ADS8864
OPA333
-
+
REF
3.3V
D
S1
S2
S3
S4
EN
GND
VDD
VDD
TMUX1104
A0 A1
1.8V Logic
Signals
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9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
The TMUX11xx family offers ulta-low input/output leakage currents and low charge injection. These devices
operate up to 5.5 V, and offer true rail-to-rail input and output of both analog and digital signals. The TMUX1104
has a low on-capacitance which allows faster settling time when multiplexing inputs in the time domain. These
features make the TMUX11xx devices a family of precision, high-performance switches and multiplexers for low-
voltage applications.
9.2 Typical Application
Figure 32 shows a 16-bit, 4 input, multiplexed, data-acquisition system. This example is typical in industrial
applications that require low distortion for precision measurements. The circuit uses the ADS8864, a 16-bit, 400-
kSPS successive-approximation-resistor (SAR) analog-to-digital converter (ADC), along with a precision
amplifier, and a 4 input mux.
Figure 32. Multiplexing Signals to External ADC
9.3 Design Requirements
For this design example, use the parameters listed in Table 2.
Table 2. Design Parameters
PARAMETERS VALUES
Supply (VDD) 3.3 V
I/O signal range 0 V to VDD (Rail to Rail)
Control logic thresholds 1.8 V compatible
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9.4 Detailed Design Procedure
The TMUX1104 can be operated without any external components except for the supply decoupling capacitors. If
the desired power-up state is disabled, the enable pin should have a weak pull-down resistor and be controlled
by the MCU via GPIO. All inputs being muxed to the ADC must fall within the recommend operating conditions of
the TMUX1104, including signal range and continuous current. For this design with a supply of 3.3V the signal
range can be 0 V to 3.3 V, and the max continuous current can be 30 mA.
The design example highlights a multiplexed data-acquisition system for highest system linearity and fast settling.
The overall system block diagram is illustrated in Figure 32. The circuit is a multichannel data-acquisition signal
chain consisting of an input low-pass filter, mux, mux output buffer, SAR ADC driver, and a reference buffer. The
architecture provides a cost-effective solution for fast sampling of multiple channels using a single ADC.
9.5 Application Curve
The TMUX1104 is capable of switching signals from high source-impedance inputs into a high input-impedance
op amp with minimal offset error because of the ultra-low leakage currents.
TA= 25°C
Figure 33. On-Leakage vs Source or Drain Voltage
10 Power Supply Recommendations
The TMUX1104 operates across a wide supply range of 1.08 V to 5.5 V. Do not exceed the absolute maximum
ratings because stresses beyond the listed ratings can cause permanent damage to the devices.
Power-supply bypassing improves noise margin and prevents switching noise propagation from the VDD supply to
other components. Good power-supply decoupling is important to achieve optimum performance. For improved
supply noise immunity, use a supply decoupling capacitor ranging from 0.1 μF to 10 μF from VDD to ground.
Place the bypass capacitors as close to the power supply pins of the device as possible using low-impedance
connections. TI recommends using multi-layer ceramic chip capacitors (MLCCs) that offer low equivalent series
resistance (ESR) and inductance (ESL) characteristics for power-supply decoupling purposes. For very sensitive
systems, or for systems in harsh noise environments, avoiding the use of vias for connecting the capacitors to
the device pins may offer superior noise immunity. The use of multiple vias in parallel lowers the overall
inductance and is beneficial for connections to ground planes.
l TEXAS INSTRUMENTS WORST BETTER /
A0
S1
GND
S3
EN
A1
S2
D
S4
VDD
TMUX1104
Via to
GND plane C
Wide (low inductance)
trace for power
WORST BETTER BEST
1W min.
W
2W
26
TMUX1104
SCDS392B –NOVEMBER 2018REVISED JULY 2019
www.ti.com
Product Folder Links: TMUX1104
Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated
11 Layout
11.1 Layout Guidelines
11.1.1 Layout Information
When a PCB trace turns a corner at a 90° angle, a reflection can occur. A reflection occurs primarily because of
the change of width of the trace. At the apex of the turn, the trace width increases to 1.414 times the width. This
increase upsets the transmission-line characteristics, especially the distributed capacitance and self–inductance
of the trace which results in the reflection. Not all PCB traces can be straight and therefore some traces must
turn corners.Figure 34 shows progressively better techniques of rounding corners. Only the last example (BEST)
maintains constant trace width and minimizes reflections.
Figure 34. Trace Example
Route high-speed signals using a minimum of vias and corners which reduces signal reflections and
impedance changes. When a via must be used, increase the clearance size around it to minimize its
capacitance. Each via introduces discontinuities in the signal’s transmission line and increases the chance of
picking up interference from the other layers of the board. Be careful when designing test points, through-
hole pins are not recommended at high frequencies.
Figure 35 illustrates an example of a PCB layout with the TMUX1104. Some key considerations are:
Decouple the VDD pin with a 0.1-µF capacitor, placed as close to the pin as possible. Make sure that the
capacitor voltage rating is sufficient for the VDD supply.
Keep the input lines as short as possible.
Use a solid ground plane to help reduce electromagnetic interference (EMI) noise pickup.
Do not run sensitive analog traces in parallel with digital traces. Avoid crossing digital and analog traces if
possible, and only make perpendicular crossings when necessary.
11.2 Layout Example
Figure 35. TMUX1104 Layout Example
l TEXAS INSTRUMENTS
27
TMUX1104
www.ti.com
SCDS392B –NOVEMBER 2018REVISED JULY 2019
Product Folder Links: TMUX1104
Submit Documentation FeedbackCopyright © 2018–2019, Texas Instruments Incorporated
12 Device and Documentation Support
12.1 Documentation Support
12.1.1 Related Documentation
Texas Instruments, True Differential, 4 x 2 MUX, Analog Front End, Simultaneous-Sampling ADC Circuit.
Texas Instruments, Improve Stability Issues with Low CON Multiplexers.
Texas Instruments, Simplifying Design with 1.8 V logic Muxes and Switches.
Texas Instruments, Eliminate Power Sequencing with Powered-off Protection Signal Switches.
Texas Instruments, System-Level Protection for High-Voltage Analog Multiplexers.
Texas Instruments, QFN/SON PCB Attachment.
Texas Instruments, Quad Flatpack No-Lead Logic Packages.
12.2 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper
right corner, click on Alert me to register and receive a weekly digest of any product information that has
changed. For change details, review the revision history included in any revised document.
12.3 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
12.4 Trademarks
E2E is a trademark of Texas Instruments.
12.5 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
12.6 Glossary
SLYZ022 TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
I TEXAS INSTRUMENTS Sample: Sample:
PACKAGE OPTION ADDENDUM
www.ti.com 10-Dec-2020
Addendum-Page 1
PACKAGING INFORMATION
Orderable Device Status
(1)
Package Type Package
Drawing Pins Package
Qty Eco Plan
(2)
Lead finish/
Ball material
(6)
MSL Peak Temp
(3)
Op Temp (°C) Device Marking
(4/5)
Samples
TMUX1104DGSR ACTIVE VSSOP DGS 10 2500 RoHS & Green NIPDAUAG Level-1-260C-UNLIM -40 to 125 1D7
TMUX1104DQAR ACTIVE USON DQA 10 3000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 104
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6) Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
I TEXAS INSTRUMENTS
PACKAGE OPTION ADDENDUM
www.ti.com 10-Dec-2020
Addendum-Page 2
I TEXAS INSTRUMENTS REEL DIMENSIONS TAPE DIMENSIONS 7 “K0 '«m» Reel Diame|er AD Dimension deswgned to accommodate the componem wwdlh E0 Dimension desxgned to accommodate the componenl \ength KO Dimenslun deswgned to accommodate the componem thickness 7 w OveraH wwdm loe earner cape i p1 Pitch between successwe cavuy cemers f T Reel Width (W1) QUADRANT ASSIGNMENTS FOR PIN 1 ORIENTATION IN TAPE O O O D O O D O Sprockemoles ,,,,,,,,,,, ‘ User Direcllon 0' Feed Pockel Quadrams
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device Package
Type Package
Drawing Pins SPQ Reel
Diameter
(mm)
Reel
Width
W1 (mm)
A0
(mm) B0
(mm) K0
(mm) P1
(mm) W
(mm) Pin1
Quadrant
TMUX1104DGSR VSSOP DGS 10 2500 330.0 12.4 5.3 3.4 1.4 8.0 12.0 Q1
TMUX1104DQAR USON DQA 10 3000 180.0 9.5 1.18 2.68 0.72 4.0 8.0 Q1
PACKAGE MATERIALS INFORMATION
www.ti.com 17-Jul-2020
Pack Materials-Page 1
I TEXAS INSTRUMENTS TAPE AND REEL BOX DIMENSIONS
*All dimensions are nominal
Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
TMUX1104DGSR VSSOP DGS 10 2500 364.0 364.0 27.0
TMUX1104DQAR USON DQA 10 3000 189.0 185.0 36.0
PACKAGE MATERIALS INFORMATION
www.ti.com 17-Jul-2020
Pack Materials-Page 2
DGSOO10A I
www.ti.com
PACKAGE OUTLINE
C
TYP
5.05
4.75
1.1 MAX
8X 0.5
10X 0.27
0.17
2X
2
0.15
0.05
TYP
0.23
0.13
0 - 8
0.25
GAGE PLANE
0.7
0.4
A
NOTE 3
3.1
2.9
B
NOTE 4
3.1
2.9
4221984/A 05/2015
VSSOP - 1.1 mm max heightDGS0010A
SMALL OUTLINE PACKAGE
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm per side.
4. This dimension does not include interlead flash. Interlead flash shall not exceed 0.25 mm per side.
5. Reference JEDEC registration MO-187, variation BA.
110
0.1 C A B
6
5
PIN 1 ID
AREA
SEATING PLANE
0.1 C
SEE DETAIL A
DETAIL A
TYPICAL
SCALE 3.200
DGSOO10A
www.ti.com
EXAMPLE BOARD LAYOUT
(4.4)
0.05 MAX
ALL AROUND 0.05 MIN
ALL AROUND
10X (1.45)
10X (0.3)
8X (0.5)
(R )
TYP
0.05
4221984/A 05/2015
VSSOP - 1.1 mm max heightDGS0010A
SMALL OUTLINE PACKAGE
SYMM
SYMM
LAND PATTERN EXAMPLE
SCALE:10X
1
56
10
NOTES: (continued)
6. Publication IPC-7351 may have alternate designs.
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.
METAL
SOLDER MASK
OPENING
NON SOLDER MASK
DEFINED
SOLDER MASK DETAILS
NOT TO SCALE
SOLDER MASK
OPENING
METAL UNDER
SOLDER MASK
SOLDER MASK
DEFINED
DGSOO10A
www.ti.com
EXAMPLE STENCIL DESIGN
(4.4)
8X (0.5)
10X (0.3)
10X (1.45)
(R ) TYP0.05
4221984/A 05/2015
VSSOP - 1.1 mm max heightDGS0010A
SMALL OUTLINE PACKAGE
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
SYMM
SYMM
1
56
10
SOLDER PASTE EXAMPLE
BASED ON 0.125 mm THICK STENCIL
SCALE:10X
DQA0010A % 0.45 0.35 1@ A@ SEQ 5®
www.ti.com
PACKAGE OUTLINE
C
8X 0.25
0.15
10X 0.43
0.30
2X
2
4X 0.5
0.55 MAX
0.05
0.00
2X 0.45
0.35
B1.1
0.9
A
2.6
2.4
(0.13) TYP
(R )0.125
USON - 0.55 mm max heightDQA0010A
PLASTIC SMALL OUTLINE - NO LEAD
4220328/A 12/2015
PIN 1 INDEX AREA
SEATING PLANE
0.08 C
1
56
10
(OPTIONAL)
PIN 1 ID
0.1 C A B
0.05 C
0.1 C A B
0.05
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
SCALE 6.000
DQA0010A
www.ti.com
EXAMPLE BOARD LAYOUT
0.07 MIN
ALL AROUND
0.07 MAX
ALL AROUND
4X (0.5)
(0.835)
8X (0.2)
10X (0.565)
(R ) TYP0.05
2X (0.4)
USON - 0.55 mm max heightDQA0010A
PLASTIC SMALL OUTLINE - NO LEAD
4220328/A 12/2015
SYMM
1
56
10
SYMM
LAND PATTERN EXAMPLE
SCALE:30X
NOTES: (continued)
3. For more information, see Texas Instruments literature number SLUA271 (www.ti.com/lit/slua271).
SOLDER MASK
OPENING
SOLDER MASK
METAL UNDER
SOLDER MASK
DEFINED
METAL
SOLDER MASK
OPENING
SOLDER MASK DETAILS
NON SOLDER MASK
DEFINED
(PREFERRED)
DQA0010A
www.ti.com
EXAMPLE STENCIL DESIGN
8X (0.2)
10X (0.565)
4X (0.5)
2X (0.36)
(0.835)
(R ) TYP0.05
USON - 0.55 mm max heightDQA0010A
PLASTIC SMALL OUTLINE - NO LEAD
4220328/A 12/2015
NOTES: (continued)
4. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
SOLDER PASTE EXAMPLE
BASED ON 0.1 mm THICK STENCIL
EXPOSED PADS 3 & 8:
90% PRINTED SOLDER COVERAGE BY AREA UNDER PACKAGE
SCALE:40X
SYMM
1
56
10
SYMM
METAL
TYP
38
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